The configurational crystalline order, closely related to the crystalline quality (CQ) of Cd1-xZnxTe single crystal as a function of x for low values of x (x < 0.08), is studied using X-ray diffraction (XRD) patterns and photoluminescence (PL) spectra. The inverse FWHM of peaks present in diffractograms (XRD-FWHM (1)), as well as the FWHM of PL-peaks (PL-FWHM-1), are related to the CQ of the material. Larger values of XRD-FWHM-1 and PL-FWHM1 mean better CQ of the growth. According to the experimental data, for a composition range of 0

Keywords:defects;optical properties;X-ray diffraction;Bridgman technique;alloys;semiconducting;II-VI materials