화학공학소재연구정보센터
Journal of Crystal Growth, Vol.237, 735-739, 2002
In situ measurement of Bi4Ge3O12 interface supercooling during melt crystal growth
The determination of the dependence for supercooling of Bi4Ge3O12 facet on growth rate V is discussed. The method of measurement of the interface temperature by an optical pyrometer in the presence of several facets with different crystallographic orientation at the measuring spot is examined. (C) 2002 Elsevier Science B.V. All rights reserved.