Journal of Crystal Growth, Vol.250, No.3-4, 405-408, 2003
Oriented growth of CdS nanoparticulate film with constant average particle size with thickness up to similar to 1 mu m
Oriented growth of hexagonal US nanoparticulate film with the C-axis perpendicular to the plane of the surface has been achieved up to a film thickness of similar to1mum, using the combination of Langmuir-Blodgett (LB) and chemical bath deposition techniques. This combination is shown to eliminate the inherent limitation of the LB technique on the film thickness (up to similar to300Angstrom). The average size of the particles has been found to be constant with the film thickness. (C) 2002 Elsevier Science B.V. All rights reserved.
Keywords:atomic force microscopy;reflectivity;thin film growth;Langmuir-Blodgett;nanoparticles;semiconducting II-VI materials