Journal of Crystal Growth, Vol.287, No.2, 349-353, 2006
Characterization of bulk grown GaN and AlN single crystal materials
Sublimation method, spontaneously nucleated as well as seeded on SiC substrates, has been employed for growing AIN bulk crystals. For GaN growth, in addition to the sublimation method using sapphire substrates, ammonothermal growth (analogous to the hydrothermal method) on HVPE GaN seeds is also being used. Thick plates/films of AIN and GaN grown by these methods have been characterized by synchrotron white beam X-ray topography (SWBXT) and high resolution X-ray diffraction (HRXRD). Results from a recent set of growth experiments are discussed. (c) 2005 Elsevier B.V. All rights reserved.
Keywords:defects;high resolution X-ray diffraction;X-ray topography;single crystal growth;aluminum nitride;gallium nitride