Journal of Crystal Growth, Vol.300, No.2, 284-287, 2007
Kinetics of dopant incorporation in GaAs grown by organometallic vapor-phase epitaxy
A diffusive capture reaction of dopant atoms by relevant host atoms, via the Rideal-Eley mechanism, in GaAs grown by organometallic vapor-phase epitaxy is shown to result in the dopant concentration in the crystal acquiring a dependence on p(Ga) (which is proportional to the growth rate) in agreement with data on S-As, Zn-Ga, and Si-Ga where p(Ga) is the partial pressure of trimethylgallium in the input gas stream. (c) 2007 Elsevier B.V. All rights reserved.
Keywords:diffusion;doping;growth models;organometallic vapor phase epitaxy;semiconducting gallium arsenide