Photon stimulated desorption (PSD) from the aluminum surface was investigated by synchrotron light at 50-150 eV. The photoelectron spectroscopy (PES) and the secondary ion mass spectroscopy (SIMS) were used to analyze the variation of surface compositions. Target currents of the aluminum alloy irradiated by synchrotron Light were measured to interpret the mechanism of ion desorption. The depth profile analysis with ion beam sputtering was used for comprehensive understandings of the correlations between desorption behaviors and surface oxides.