화학공학소재연구정보센터
Applied Surface Science, Vol.183, No.1-2, 39-42, 2001
Refractive index profiles of MeV phosphor ion implanted planar waveguide in KTP
The first MeV phosphor ion implanted planar optical waveguide in KTiOPO4 (KTP) is reported. The modes in the KTP waveguide were measured by dark mode coupling method using a model 2010 prism coupler. The refractive index profile was analyzed by reflectivity calculation method (RCM) at room temperature, after treatment at 200 degreesC for 30 min (in air) and 77 K for 150 min (in liquid nitrogen), respectively.