In this paper we present results on the property for surface topography characterization of carbon nanotube (CNT) probes as applied to atomic force microscopy (AFM). The imaging stability and lifetime of CNT probes are studied on a relatively hard surface. The results indicate that the resolution and lifetime of the CNT probe is better than silicon tip and sample surface wear is minimized with CNT probe. The CNT probe with its high aspect ratio can trace deeper troughs than the conventional silicon probe. (C) 2004 Elsevier B.V. All rights reserved.