화학공학소재연구정보센터
Applied Surface Science, Vol.236, No.1-4, 186-191, 2004
Structure and scintillation properties of CsI(Tl) epitaxial layers
CsI(TI) layers of microcolumnar morphology were grown on LiF substrates by vacuum deposition. Structure and scintillation properties of layers were examined using X-ray diffraction, scanning electron microscopy, scintillation pulse height spectrometry. Single crystalline structure of constituent blocks and increased light yield of films was observed. (C) 2004 Elsevier B.V. All rights reserved.