Study of the surface structure of Si(111)-6 X 1(3 X 1)-Ag using - X-ray crystal truncation rod scattering

Sumitani K; Masuzawa K; Hoshino T; Nakatani S; Takahashi T; Tajiri H; Akimoto K; Sugiyama H; Zhang XW; Kawata H

Applied Surface Science, Vol.252, No.15, 5288-5291, 2006

DOI10.1016/j.apsusc.2005.12.054 Export Citation

Study of the surface structure of Si(111)-6 X 1(3 X 1)-Ag using - X-ray crystal truncation rod scattering

Sumitani K, Masuzawa K, Hoshino T, Nakatani S, Takahashi T, Tajiri H, Akimoto K, Sugiyama H, Zhang XW, Kawata H

The structure of the Si(111)-6 x 1-Ag surface is investigated using crystal truncation rod (CTR) scattering along 00 rod. For the measurement, we developed a manipulator suitable for observing CTR scattering at large momentum transfer perpendicular to the surface. The heights of the silver and reconstructed silicon atoms from the substrate were determined. We also compared the obtained positions with those of the Si(111)-root 3 x root 3-Ag surface and found that the heights of those reconstructed atoms are almost the same. (c) 2005 Elsevier B.V. All rights reserved.

Keywords:Si(111)-6 X 1-Ag;structure analysis;surface X-ray diffraction;crystal truncation rod