Applied Surface Science, Vol.253, No.3, 1365-1370, 2006
Characterization of a thin CeO2-ZrO2-Y2O3 films electrochemical deposited on stainless steel
In this paper, we report for the first time formation of a thin CeO2-ZrO2-Y2O3 films electrodeposited on a stainless steel substrate. The samples have been characterized by X-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM) and X-ray diffraction (XRD). The XRD and XPS data indicate formation of a solid solution and additional existence of Cc(3+) states near the surface. After annealing, SEM examination has shown a microstructure formed by dispersed spherical agglomerates having a size between 20 and 60 nm. (c) 2006 Elsevier B.V. All rights reserved.