Advanced Materials, Vol.18, No.12, 1549-1549, 2006
Formation of contact holes on bumps on semiconductor chip by micro-Moses effect
Ferromagnetic bumps can effectively be dewetted using the micro-Moses effect, resulting in formation of contact holes on the bumps. Due to the contact holes, electrical contact is made to a complementary flip-chip structure (see figure). In this way, the connection of two chips can be successfully achieved.