The structure of PMeT films were studied by AFM at different stages of the electrodeposition process : nucleation, first layer and successive thicker layers were imaged. Dielectric constant spectra were determined by spectroscopic ellipsometry for the corresponding depositions. The analysis of results identifies differences between intrinsic properties, (such as the energy of optical transitions), which do not depend on structure and effective properties, (such as the absolute values of dielectric constants), which depend greatly on it.