화학공학소재연구정보센터
Electrochimica Acta, Vol.42, No.16, 2555-2558, 1997
Simulation of Voltammogram on Rough Electrode
Linear scan and cyclic voltammetries (LSV and CV) of a reversible redox couple are simulated on rough electrode surfaces constructed with Weierstrass function by Monte Carlo techniques. A scaling law relationship that depends on surface dimension is obtained between peak current and scan rate. The shift of peak potential of LSV and the change of peak potential separation (Delta E-p,) of CV on a rough surface are also discussed.