화학공학소재연구정보센터
Electrochimica Acta, Vol.44, No.21-22, 3651-3657, 1999
High resolution in-situ imaging of reactive heterogeneous surfaces
A modified near-field optical microscope (NSOM) was used to locate reactive sites on polycrystalline titanium immersed in sulfuric acid. Photoelectrochemical imaging was carried out on the NSOM by using a new shear-force feedback method, PEM with simultaneous independent topography (using the tuning fork method) resolved submicron features at reactive sites at inclusions and grain boundaries; Both PEM and topographic images were obtained in-situ with high lateral resolution by using specially fabricated tips with 100 nm aperture.