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Electrochemical and Solid State Letters, Vol.4, No.2, G20-G22, 2001
Chemical mechanical polishing of copper and tantalum in potassium iodate-based slurries
Polish rates of copper and tantalum were measured using potassium iodate-based slurries containing silica abrasives for several concentrations of potassium iodate and pH. The tantalum polish rate increases rapidly with pH beyond pH 10.0 and with 3% silica reaches a value of about 215 nm/min while copper polish rate under the same conditions is only about 45 nm/min. Also, the dissolution/passivation behaviors of copper as well as tantalum were investigated by electrochemical measurements.