This paper presents the result of the most recent investigations of the galvanoluminescence (GL) spectra of porous oxide layers formed by aluminum anodization in oxalic acid. A new experimental procedure for GL spectra recording was established, This method can be easily applied to GL spectral measurements on porous anodic films. The spectra were recorded for different values of temperature and anodization current density. Two spectral peaks at 446 and 485 nm, respectively, were observed, indicating the probable existence of two kinds of luminescence centers incorporated in the oxide. In addition, it was discovered that the intensity ratio for the two peaks changes with the current density. Those GL measurements, with further photoluminescent (PL) measurements should lead to a definitive explanation of the GL phenomena, as well as of the nature and distribution of luminescent centers in both porous and barrier oxide films on aluminum.