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Electrochemical and Solid State Letters, Vol.10, No.4, H123-H126, 2007
Impact of atomistic surface structure on macroscopic surface reaction rate in MOVPE of GaAs
In situ reflectance anisotropy spectroscopy was employed to interpret the surface reaction rate constant (k(s)) of a Ga precursor on a GaAs(001) surface in metallorganic vapor-phase epitaxy (MOVPE), which was extracted by the analysis of selective-area growth. The activation energy of ks significantly decreased above 625-630 degrees C. Correspondingly, the surface anisotropy spectrum changed around 600 degrees C from that of surface reconstruction containing Ga dimers at lower temperatures to that of c(4 x 4)-like reconstruction with As dimers at higher temperatures. These observations suggest a step-flow growth mode at higher temperatures and an island growth mode at lower temperatures. (c) 2007 The Electrochemical Society.