화학공학소재연구정보센터
Journal of the American Ceramic Society, Vol.90, No.11, 3596-3600, 2007
Local structures of bismuth ion in bismuth-doped silica glasses analyzed using bi L-III x-ray absorption fine structure
Local structures around a bismuth ion in bismuth-doped silica glasses (BiSG) are analyzed using a Bi L-III X-ray absorption fine structure (XAFS). The XAFS spectrum of crystalline alpha-Bi2O3 was also measured for comparison with BiSG whose first peaks are about 0.1 angstrom less than alpha-Bi2O3 in radial structure functions. According to curve-fitting results using FEFF 8.2, the Bi-O distances of the first and second neighboring coordination spheres are estimated to be 2.1 and 2.3 angstrom, respectively. The former corresponds to Bi5+-O bonding and the latter to Bi3+-O bonding compared with the Bi-O distances in typical crystals including Bi3+ and Bi5+ ions. The above results show that Bi ions in BiSG exist as both Bi3+ and Bi5+ states, which is also supported by X-ray absorption near the edge structure spectra of BiSG.