Polarization-modulation infrared reflection-absorption spectroscopy (PMIRRAS) measurements have been carried out so as to analyze atactic polystyrene layers transferred (nano-wear) onto hydroxylated silicon substrates. This technique has been used to determine the three-dimensional orientation geometry of aliphatic part and phenyl rings of rubbed polystyrene on hydroxyl-terminated wafers. The PMIRRAS analysis of PS bulk and transfer film showed an orientation of chains under different mechanical stresses. (c) 2007 Elsevier B.V. All rights reserved.