A method for characterization of sub-nanometer thick Co/V and Co/Mo interfaces is proposed that uses magneto-optical ellipsometry. Both the polar Kerr rotation and ellipticity are fitted simultaneously to different models of interface layer. The magneto-optical data are measured for varying thicknesses of the cobalt layer and overlayer by scanning of a laser beam over the samples with two orthogonal wedges. Decrease of magneto-optical effect at both interfaces Co/V and Co/Mo were observed, which corresponds to interface layers of thicknesses ranging from one to two monoatomic layers. In the case of vanadium, the interface layer is sharper and can be explained either by reduced magnetic moment of cobalt, or by anti-parallel magnetic moment of vanadium near the Co/V interface. (C) 2007 Elsevier B.V. All rights reserved.