화학공학소재연구정보센터
Journal of Vacuum Science & Technology A, Vol.26, No.2, 253-258, 2008
Low temperature plasma etching for Si3N4 waveguide applications
Highly selective and anisotropic low temperature electron cyclotron resonance plasma etching process for silicon nitride optical rib waveguide devices compatible with integrated circuit technology is presented. Etching at low temperatures (similar to 30 degrees C) with SF6/O-2 chemistry in combination with a silicon dioxide hard mask achieved good anisotropy with the vertical sidewalls. (C) 2008 American Vacuum Society.