Previous Article Next Article Table of Contents Thin Solid Films, Vol.516, No.2-4, 481-485, 2007 DOI10.1016/j.tsf.2007.07.139 Export Citation Optical refractive index and static permittivity of mixed Zr-Si oxide thin films prepared by ion beam induced CVD Ferrer FJ, Frutos F, Garcia-Lopez J, Gonzalez-Elipe AR, Yubero F Mixed oxides ZrxSi1-xO2 (0 Keywords:Zr-Si oxides;thin films;IBICVD;refractive index;static permittivity [Referenced By] Please enable JavaScript to view the comments powered by Disqus.
