Thin Solid Films, Vol.516, No.10, 2922-2927, 2008
Optical constants of electroplated Bi2Te3 films by Mueller matrix spectroscopic ellipsometry
We synthesized polycrystalline Bi2+xTe3-x(-0.2
Keywords:bismuth telluride;electrochemistry;electroplated films;ellipsometry;Mueller matrix;optical properties;anisotropy;in situ characterization