Journal of Crystal Growth, Vol.310, No.11, 2885-2889, 2008
Preparation and characterization of fiber-textured SrAl2O4 : Eu films grown using a homo-buffer layer
This paper describes the preparation and characterization of fiber-textured SrAl2O4:Eu films on a quartz glass substrate using a homobuffer layer. The effect of the buffer layer on the crystallinity and adhesion was investigated by cross-section transmission electron microscopy and X-ray diffraction (XRD). The results show that the prepared film was not only well crystallized but also highly textured. The preferred orientation of this textured film was confirmed to be (0 3 1) by pole figure measurement. In addition, this film exhibits excellent optical transparency, with an average transmittance of more than 80% in the visible range. (c) 2008 Elsevier B.V. All rights reserved.
Keywords:crystal structure;X-ray diffraction;physical vapor deposition process;inorganic compound;phosphors