Advanced Materials, Vol.20, No.13, 2573-2573, 2008
Simultaneous use of small- and wide-angle X-ray techniques to analyze nanometerscale phase separation in polymer heterojunction solar cells
Using grazing-incidence small-angle X-ray scattering and wide-angle X-ray diffraction techniques to analyze the nanoscale phase separation of P3HT and PCBM after annealing, the effects of the sizes of the PCBM clusters and P3HT crystallites on the power conversion efficiency of bulk heterojunction solar cells are studied.