Influence of nickel oxide nanolayer and doping in organic light-emitting devices

Sungho Woo; Jaehyun Kim; Gwijeong Cho; Kangpil Kim; Hongkeun Lyu; Youngkyoo Kim

Journal of Industrial and Engineering Chemistry, Vol.15, No.5, 716-718, September, 2009

DOI10.1016/j.jiec.2009.09.051 Export Citation

Influence of nickel oxide nanolayer and doping in organic light-emitting devices

Sungho Woo^†, Jaehyun Kim, Gwijeong Cho¹, Kangpil Kim, Hongkeun Lyu, and Youngkyoo Kim^{1, †}

Division of Nano and Bio Technology, Daegu Gyeongbuk Institute of Science and Technology (DGIST), Daegu 704-230, Republic of Korea
¹Organic Nanoelectronics Laboratory, Department of Chemical Engineering, Kyungpook National University, Daegu 702-701, Republic of Korea

E-mail:,

Here we report the effect of introducing nickel oxide (NiO) on the performance of organic light-emitting devices (OLEDs) based on small molecules. For the purpose of aligning the NiO deposition with the conventional OLED process, we employed a thermal evaporation method using the NiO powders. To understand the influence of the NiO introduction, we fabricated two types of devices: (1) OLED with the NiO nanolayer and (2) OLED with the NiO-doped hole transport layer. Results show that the NiO introduction improved the hole injection in both types of OLED. However, the device with the NiO nanolayer exhibited greatly improved efficiency, whereas the efficiency was significantly lowered for the device with the NiO-doped hole transport layer.

Keywords:OLED;NiO;Nanolayer;Thermal evaporation;Hole injection

[References]

Tang CW, VanSlyke SA, Appl. Phys. Lett., 51, 913 (1987)
Kim Y, Ha CS, Advances in Organic Light-emitting Device, Trans Tech Publications, Switzerland, 2008 (Chapter 1);
Yook KS, Jeon SO, Joo CW, Lee JY, J. Ind. Eng. Chem., 15(3), 420 (2009)
Xu X, Yu G, Liu Y, Zhu D, Displays, 27, 24 (2006)
Kim Y, Nanotechnology, 19, 355207 (2008)
Lee JY, J. Ind. Eng. Chem., 14(5), 676 (2008)
Fujihira M, Ganzorig C, in: Salaneck WR (Ed.), Science and Technology for Photonic and Optoelectronic Applications, Marcel Dekker, New York, 2001 , p. 817.
Lee JG, Kim Y, Jang SH, Kwon SN, Jeong K, Appl. Phys. Lett., 72, 1757 (1998)
Wu CC, Wu CI, Sturm JC, Kahn A, Appl. Phys. Lett., 70, 1348 (1997)
Sugiyama K, Ishii H, Ouchi Y, Seki K, J. Appl. Phys., 87, 295 (2000)
Qiu C, Xie Z, Chen H, Wong M, Kwok HS, J. Appl. Phys., 93, 3253 (2003)
Ganzorig C, Kwak KJ, Yagi K, Fujihira M, Appl. Phys. Lett., 79, 272 (2001)
Huang Q, Cui J, Yan H, Veinot JGC, J. Marks, Appl. Phys. Lett., 81, 3528 (2002)
Blochwitz J, Pfeiffer M, Fritz T, Leo K, Appl. Phys. Lett., 73, 729 (1998)
Chang CC, Hsieh MT, Chen JF, Hwang SW, Chen CH, Appl. Phys. Lett., 89, 253504 (2006)
Olivier J, Servet B, Vergnolle M, Mosca M, Garry G, Synth. Met., 122, 87 (2001)
Chan IM, Hsu TY, Hong FC, Appl. Phys. Lett., 81, 1899 (2002)
Nakasa A, Adachi M, Usami H, Suzuki E, Taniguchi Y, Thin Solid Films, 498(1-2), 240 (2006)
Oey CC, Djurisic AB, Kwong CY, Cheung CH, Chan WK, Nunzi JM, Chui PC, Thin Solid Films, 492(1-2), 253 (2005)
Irwin MD, Buchholz B, Hains AW, Chang RPH, Marks TJ, PNAS, 105, 2783 (2008)

[Referenced By]

[Related Articles]

[1] Tang CW, VanSlyke SA, Appl. Phys. Lett., 51, 913 (1987)

[2] Kim Y, Ha CS, Advances in Organic Light-emitting Device, Trans Tech Publications, Switzerland, 2008 (Chapter 1);

[3] Yook KS, Jeon SO, Joo CW, Lee JY, J. Ind. Eng. Chem., 15(3), 420 (2009)

[4] Xu X, Yu G, Liu Y, Zhu D, Displays, 27, 24 (2006)

[5] Kim Y, Nanotechnology, 19, 355207 (2008)

[6] Lee JY, J. Ind. Eng. Chem., 14(5), 676 (2008)

[7] Fujihira M, Ganzorig C, in: Salaneck WR (Ed.), Science and Technology for Photonic and Optoelectronic Applications, Marcel Dekker, New York, 2001 , p. 817.

[8] Lee JG, Kim Y, Jang SH, Kwon SN, Jeong K, Appl. Phys. Lett., 72, 1757 (1998)

[9] Wu CC, Wu CI, Sturm JC, Kahn A, Appl. Phys. Lett., 70, 1348 (1997)

[10] Sugiyama K, Ishii H, Ouchi Y, Seki K, J. Appl. Phys., 87, 295 (2000)

[11] Qiu C, Xie Z, Chen H, Wong M, Kwok HS, J. Appl. Phys., 93, 3253 (2003)

[12] Ganzorig C, Kwak KJ, Yagi K, Fujihira M, Appl. Phys. Lett., 79, 272 (2001)

[13] Huang Q, Cui J, Yan H, Veinot JGC, J. Marks, Appl. Phys. Lett., 81, 3528 (2002)

[14] Blochwitz J, Pfeiffer M, Fritz T, Leo K, Appl. Phys. Lett., 73, 729 (1998)

[15] Chang CC, Hsieh MT, Chen JF, Hwang SW, Chen CH, Appl. Phys. Lett., 89, 253504 (2006)

[16] Olivier J, Servet B, Vergnolle M, Mosca M, Garry G, Synth. Met., 122, 87 (2001)

[17] Chan IM, Hsu TY, Hong FC, Appl. Phys. Lett., 81, 1899 (2002)

[18] Nakasa A, Adachi M, Usami H, Suzuki E, Taniguchi Y, Thin Solid Films, 498(1-2), 240 (2006)

[19] Oey CC, Djurisic AB, Kwong CY, Cheung CH, Chan WK, Nunzi JM, Chui PC, Thin Solid Films, 492(1-2), 253 (2005)

[20] Irwin MD, Buchholz B, Hains AW, Chang RPH, Marks TJ, PNAS, 105, 2783 (2008)