화학공학소재연구정보센터
Applied Surface Science, Vol.255, No.21, 8738-8742, 2009
Towards chemical state resolution in regularized depth profiles derived from ARXPS data taken on plasma-oxidized polystyrene
ARXPS data obtained from a plasma-oxidized polystyrene sample were evaluated by means of 3-parameter and 10-parameter depth pro. le models, with and without regularization. It was found that the partially regularized 3-parameter model gave equivalent results compared to the regularized 10-parameter model, but requiring one fifteenth of the computational effort. (C) 2009 Elsevier B.V. All rights reserved.