CdS and Si semiconductor nanopraticles were embedded in a polymer matrix and characterized using various techniques. The surface properties and size distribution of the nanoparticles were monitored by POM and SEM and found to be uniform but around the crystalline frameworks of the polymer. XRD and FTIR analysis have been used to ensure the composite nature and particle size of the semiconductor loaded films. The electrical conductivity of these films were evaluated and found to increase with semiconductor dispersion and attains a percolation threshold at optimum composition. This composition and the distribution of the clusters is shown to vary with the type of the semiconductor, i.e., CdS or Si. (C) 2009 Elsevier B.V. All rights reserved.