La2Zr2O7 (LZO) buffer layers have been prepared on Ni-5 at%W tapes using chemical solution deposition. The local texture of the deposited layers has been studied throughout the thickness using ion-beam sputtering and electron back-scattering diffraction (EBSD). The processing conditions have been optimised afterwards based on these results leading to a highly textured surface for annealing temperatures of 1050 degrees C. YBa2CU3O7-x, layers were deposited by pulsed laser deposition on these single LZO buffer layers and studied in detail using X-ray diffraction and EBSD. A close correlation was found between the surface texture and the superconducting properties. (C) 2008 Elsevier B.V. All rights reserved.