화학공학소재연구정보센터
Journal of Crystal Growth, Vol.310, No.23, 4790-4794, 2008
Isoelectronic nitrogen delta-doping in GaP and single-photon emission from individual nitrogen pairs
Nitrogen (N) delta-doping in GaP was studied using low-pressure metalorganic chemical vapor deposition at 650 degrees C. Secondary ion mass spectroscopy measurements revealed that the profile of atomic N concentrations is abrupt and symmetrical, indicating a good-quality delta-doping. For the delta-doped sample of a dilute N sheet density, spatially dependent emission spectra from N-related isoelectronic traps were observed at 30 K with micro-photoluminescence (mu-PL). Besides the well-known NNi pairs, as well as the so-called A line, a new peak was observed at 2.2847eV. We successfully mapped the spatial distribution of NN4 pairs by using 0th order diffraction of a spectrometer with a narrow-band pass filter. By applying this technique to several samples with different N sheet densities, it was found that the densities of NNi and the new peak have square and cubic dependence on the sheet density of N atoms, respectively. After identifying a single NN4 Pair using the mu-PL, strong photon antibunching under continuous optical pumping was demonstrated, which is good evidence for clear single-photon emission from an individual N-N pair. (C) 2008 Elsevier B.V. All rights reserved.