화학공학소재연구정보센터
Journal of Crystal Growth, Vol.311, No.10, 2853-2856, 2009
Characterizations of GaN films and AlGaN/GaN heterostructures on vicinal sapphire (0001) substrates grown by MOCVD
GaN films and AlGaN/GaN heterostructures grown on vicinal sapphire (0001) substrates by metalorganic chemical vapor deposition (MOCVD) are investigated. It is found that surface morphologies of GaN films depend on the vicinal angle, however, they are not sensitive to the inclination directions of the substrate. The optimized vicinal angle for obtaining excellent surface morphology is around 0.5 degrees. This conclusion is also confirmed by characterizing the electrical property of two-dimensional electron gas (2DEG) in the AlGaN/GaN heterostructure. (C) 2009 Elsevier B.V. All rights reserved.