Previous Article Next Article Table of Contents Journal of Materials Science, Vol.45, No.5, 1411-1418, 2010 DOI10.1007/s10853-009-4103-6 Export Citation A non-destructive method for thickness measurement of thin electrospun membranes using white light profilometry Affandi NDN, Truong YB, Kyratzis IL, Padhye R, Arnold L Please enable JavaScript to view the comments powered by Disqus.
