Differential charging is often regarded as a problem in X-ray photoelectron spectroscopy (XPS) studies, especially for insulating or partially conducting samples. Neutralization techniques have been developed to circumvent this effect. Instead of neutralizing the positive charge, which is often the technique to obtain good quality data, it is possible to exploit this phenomenon to get useful information about the sample. An attempt is made here to use this differential charging to study the mono- and multilayer Langmuir-Blodgett (LB) films of cadmium arachidate on silicon substrate. The surface potential was probed by measuring XPS line shift with respect to their neutral position and was found to have correlation with the thickness of the films. No differential charging was observed in the monolayer LB film where there was only one layer of cadmium headgroup. Significant differential charging was observed for multilayer films, the total charging as well as the differential charging in these films increase with increasing number of layers. Angle-resolved XPS measurements were performed to obtain additional information about the structure of the films. Charging of the upper layer of the films close to the vacuum interface was found to be less compared to that of the interior. The discrete cadmium layers were found to be more differentially charged compared to the continuous hydrocarbon stacks in the multilayer LB films. Charging of the discrete cadmium layers has been utilized to obtain quantitative information of the multilayer LB films.