화학공학소재연구정보센터
Journal of Physical Chemistry B, Vol.113, No.15, 4987-4990, 2009
Measurement of DNA Morphological Parameters at Highly Entangled Regime on Surfaces
The morphology of circular DNA deposited from a solution on the mica surface is analyzed from the power spectrum density (PSD) of the atomic force microscopy (AFM) images. Sample morphology is modulated in a broad range of concentration C from isolated molecules to highly entangled networks. DNA exhibits a multiaffine behavior with two correlation length scales: the persistence length P which remains constant (approximate to 50 nm) within the C range and the intermolecular distance which exhibits a decay with increasing C. Applying a diffusion based model in which xi scales as xi approximate to D-0.25 center dot C-0.5, we extracted the DNA diffusion coefficient D approximate to 2 x 10(-7) cm(2)/S. This value is consistent with a high-molecular-weight plasmid DNA supercoiled in the solution.