화학공학소재연구정보센터
Journal of Vacuum Science & Technology B, Vol.26, No.4, 1606-1608, 2008
Atomic force microscopy and scanning tunneling microscopy-spectroscopy characterization of ZnO nanobelts
The surface properties of ZnO nanobelts grown by chemical vapor deposition were investigated by tapping mode atomic force microscopy (AFM) and scanning tunneling microscopy (STM). AFM images showed a type 1 (high aspect ratio) nanobelt lying across a type 2 (low aspect ratio) nanobelt, bending at an angle of 20.9 degrees without breaking. Step defects were also observed on the surface for the first time, with step edges running along the [-1-120] direction. These surface defects are also observed by STM while scanning tunneling spectroscopy measurements yield a band gap of 3.3 eV and near flatband conditions. (C) 2008 American Vacuum Society.