In order to clarify the mechanism of low-macroscopic-field (LMF) electron emission from carbon related materials, atomistic properties including local tunneling barrier height (LBH) and field emission (FE) current distributions of the arc-prepared carbon thin film have been measured by using scanning tunneling microscopy. From the LBH images, it is found that the carbon thin film surface consists of nanometer-scale graphite grains whose crystallinities and electronic properties are different although the local work function of the film is rather homogeneous. The obtained FE images show that the FE currents are varied more than one order of magnitude, depending on the grains, and that the FE current is higher at the edge of the individual grains. The authors cannot find any specific emission sites that give extremely higher emission currents, indicating that the specific emission sites such as high-aspect-ratio nanoprotrusions or atomistic defects are not responsible to the LMF electron emission from carbon related materials.