This work reports the application of a patterned thin film of polyisobutylene (PIB) irradiated with an electron beam as a time temperature integrator, i.e., it device that is able to record the thermal history of a product. The device is fabricated by irradiation with an electron beam of regions of a PIB thin Film to different doses of electrons. A different dewetting behavior occurs at these regions upon thermal exposure, depending on the dose. The experimental results are quantified by means of a model of dewetting based on nucleation and growth of holes in a strong slippage regime.