화학공학소재연구정보센터
Korean Journal of Chemical Engineering, Vol.12, No.1, 1-11, January, 1995
CHEMICAL VAPOR DEPOSITION OF ALUMINUM FOR ULSI APPLICATIONS
Aluminum has been used widely as a conducting material in the fabrication of integrated circuits, and chemical vapor deposition process for Al has been actively investigated for the application in ultra large scale integration. In this review, various precursors, mainly alkyl aluminum and alane compounds, and reaction mechanisms of these precursors in Al CVD are described. Epitaxial growth and selectivity of the deposition are also discussed. In addition to thermal reactions, reactions, plasma and photochemical reactions are also briefly described.
  1. Learn AJ, J. Electrochem. Soc., 123, 994 (1976)
  2. Pramanik D, Saxena AN, Solid State Technol., 26(1), 127 (1983)
  3. Pramanik D, Saxena AN, Solid State Technol., 26(3), 131 (1983)
  4. Garosshen TJ, Stephenson TA, Slavin TP, J. Metals, 37(5), 55 (1985)
  5. Levy RA, Green ML, J. Electrochem. Soc., 134, 37 (1987) 
  6. Pramanik D, Saxena AN, Solid State Technol., 33(3), 73 (1990)
  7. Sequeda FO, J. Metals, 37(5), 43 (1985)
  8. Green ML, Levy RA, J. Metals, 37(6), 63 (1985)
  9. Malik F, Thin Solid Films, 206, 70 (1991) 
  10. Vaidya S, Sinha AK, Thin Solid Films, 75, 253 (1981) 
  11. Graper EB, J. Vac. Sci. Technol., 8, 333 (1971) 
  12. Hoffman V, Solid State Technol., 19(12), 57 (1976)
  13. Vorous TV, Solid State Technol., 19(12), 62 (1976)
  14. Fuller T, Ghate PB, Thin Solid Films, 64, 25 (1979) 
  15. Levy RA, Parrillo LC, Lecheler LJ, Knoell RV, J. Electrochem. Soc., 132, 159 (1985) 
  16. Yamada I, Takagi T, IEEE Trans. Electron Devices, 34, 1018 (1987)
  17. Movchan BA, Demchishin AV, Phys. Met. Metallogr., 28, 83 (1969)
  18. Thornton JA, J. Vac. Sci. Technol., 11, 666 (1974) 
  19. Thornton JA, Annu. Rev. Mater. Sci., 7, 239 (1977) 
  20. Messier R, Giri AP, Roy RA, J. Vac. Sci. Technol. A, 2, 500 (1984) 
  21. Messier R, Yehoda JE, J. Appl. Phys., 58, 3739 (1985) 
  22. Curran JE, Page JS, Pick U, Thin Solid Films, 97, 259 (1982) 
  23. Wan LJ, Chen BQ, Kuo KH, J. Vac. Sci. Technol. A, 6, 3160 (1988) 
  24. Raupp GB, Cale TS, Chem. Mater., 1, 207 (1989) 
  25. Cooke MJ, Vacuum., 35, 67 (1985) 
  26. Herman IP, Chem. Rev., 89, 1323 (1989) 
  27. Jensen KF, Kern W, "Thin Film Processes II," Academic Press, San Diego, p. 283 (1991)
  28. Jensen KF, Kern W, "Thin Film Processes II," Academic Press, San Diego, p. 443 (1991)
  29. Rhee S, Rhee J, "CVD Handbook," Bando Publishing Co. (Translated from Japanese Version into Korean), Seoul (1993)
  30. Hitchman H, Jensen KF, "Chemical Vapor Deposition-Principles and Applications," Academic Press, New York (1993)
  31. Jensen KF, Einset EO, Fotiadis DI, Annu. Rev. Fluid Mech., 23, 197 (1991) 
  32. deCroon MHJM, Giling LJ, J. Electrochem. Soc., 137, 2867 (1990) 
  33. Moffat H, Jensen KF, J. Cryst. Growth, 77, 108 (1986) 
  34. Fotiadis DI, Kieda S, Jensen KF, J. Cryst. Growth, 102, 441 (1990) 
  35. Wilkinson G, Stone FGA, Abel EW, "Comprehensive Organometallic Chemistry," Pergamon Press, Oxford, Vol. 1, p. 555 (1982)
  36. Wiberg E, Amberger E, "Hydrides of the Elements of Main Groups I-IV," Elsevier, Amsterdam, p. 381 (1971)
  37. Cooke MJ, Heinecke RA, Stern RC, Maes JW, Solid State Technol., 25(12), 62 (1982)
  38. Green ML, Levy RA, Nuzzo RG, Coleman E, Thin Solid Films, 114, 367 (1984) 
  39. Levy RA, Green ML, Gallagher PK, J. Electrochem. Soc., 131, 2175 (1984) 
  40. Powell CF, "Vapor Deposition," John Wiley and Sons, New York, p. 277 (1966)
  41. Kwakman LFT, Sluijk BG, Piekaar H, Granneman EHA, "Tungsten and Other Refractory Metals for VLSI Applications IV," MRS, Pittsbugh, p. 315 (1989)
  42. Bent BE, Nuzzo RG, Dubois LH, J. Vac. Sci. Technol. A, 6, 1920 (1988) 
  43. Bent BE, Nuzzo RG, Dubois LH, Mater. Res. Soc. Symp. Proc., 101, 177 (1988)
  44. Bent BE, Nuzzo RG, Dubois LH, J. Am. Chem. Soc., 111, 1634 (1989) 
  45. Bent BE, Dubois H, Nuzzo RG, Mater. Res. Soc. Symp. Proc., 131, 327 (1989)
  46. Terao H, Sunakawa H, J. Cryst. Growth, 68, 157 (1984) 
  47. Frese V, Regel GK, Hardtddegen H, Brauers A, Balk P, Hostalek M, Lokai M, Pohl L, Miklis A, Werner K, J. Elec. Mater., 19, 305 (1990)
  48. Bent BE, Nuzzo RG, Zegarski BR, Dubois LH, J. Am. Chem. Soc., 113, 143 (1991)
  49. Bent BE, Nuzzo RG, Zegarski BR, Dubois LH, J. Am. Chem. Soc., 113, 1137 (1991) 
  50. Egger KW, J. Am. Chem. Soc., 91, 2867 (1968) 
  51. Egger KW, Int. J. Chem. Kinet., 1, 459 (1969) 
  52. Mantell DA, J. Vac. Sci. Technol. A, 9, 1045 (1991) 
  53. Mantell DA, Mater. Res. Soc. Symp. Proc., 131, 357 (1989)
  54. Mantell DA, J. Vac. Sci. Technol. A, 7, 630 (1989) 
  55. Higashi GS, Appl. Surf. Sci., 43, 6 (1989) 
  56. Higashi GS, Raghavachari K, Steigerwald ML, J. Vac. Sci. Technol. B, 8, 103 (1990) 
  57. Laubengayer AW, Gilliam WF, J. Am. Chem. Soc., 63, 477 (1941) 
  58. Coates GE, Green MLH, Powell P, Wade K, "Principles of Organometallic Chemistry," Methuen, London, p. 36 (1971)
  59. Salaneck WR, Bergman R, Sundgren J, Rockeett A, Motooka T, Greene JE, Surf. Sci., 198, 461 (1988) 
  60. Motooka T, Rockett A, Fons P, Greene JE, Salaneck WR, Bergman R, Sundgren JE, J. Vac. Sci. Technol. A, 6, 3115 (1988) 
  61. Motooka T, Fons P, Greene JE, Mater. Res. Soc. Symp. Proc., 131, 345 (1989)
  62. Gow TR, Lin R, Cadwell LA, Lee F, Backman AL, Masel RI, Chem. Mater., 1, 406 (1989) 
  63. Biswas DR, Ghosh C, Layman RL, J. Electrochem. Soc., 130, 234 (1983) 
  64. Squire DW, Dulcey CS, Lin MC, J. Vac. Sci. Technol. B, 3, 1513 (1985) 
  65. Squire DW, Dulcey CS, Lin MC, Chem. Phys. Lett., 116, 525 (1985) 
  66. Lee F, Gow TR, Lin R, Backman AL, Lubben D, Masel RI, Mater. Res. Soc. Symp. Proc., 131, 339 (1989)
  67. Wee A, Murrell AJ, French CL, Price RJ, Jackman RB, Foord JS, Mater. Res. Soc. Symp. Proc., 131, 351 (1989)
  68. Gow TR, Lee F, Lin R, Backman AL, Masel RI, Vacuum., 41, 951 (1990) 
  69. Strongin DR, Comita PB, Mater. Res. Soc. Symp. Proc., 158, 21 (1990)
  70. Strongin DR, Comita PB, J. Phys. Chem., 95, 1329 (1991) 
  71. Bartram ME, Michalske TA, Rogers JW, J. Phys. Chem., 95, 4453 (1991) 
  72. Zhou Y, Henderson Ma, White JM, Surf. Sci., 221, 160 (1989) 
  73. Yeddanapalli LM, Schubert CC, J. Chem. Phys., 14, 1 (1945)
  74. Rytz-Froidevaux Y, Salathe RP, Gilgen HH, Phys. Lett., 84A, 216 (1981) 
  75. Leys MR, Chemtronics, 3, 179 (1988)
  76. Shanov V, Ivanov B, Popov C, Thin Solid Films, 207, 71 (1992) 
  77. Suzuki N, Anayama C, Masu K, Tsubouchi K, Mikoshiba N, Jpn. J. Appl. Phys., 25, 1236 (1986) 
  78. Carlsson J, Gorbatkin S, Lubben D, Greene JE, J. Vac. Sci. Technol. B, 9, 2759 (1991) 
  79. Bhat R, Koza Ma, Chang CC, Schwarz SA, J. Cryst. Growth, 77, 7 (1986) 
  80. Smith WR, Wartik T, J. Inorg. Nucl. Chem., 29, 629 (1967) 
  81. Kobayashi N, Fukui T, Elec. Lett., 20, 887 (1984)
  82. Keuch TF, Veuhoff E, Kuan TS, Deline V, Potemski R, J. Cryst. Growth, 77, 257 (1986) 
  83. Wartik T, Schlesinger HI, J. Am. Chem. Soc., 75, 835 (1953) 
  84. Anderson GA, Almenningen A, Forgaard FR, Haaland A, J. Chem. Soc.-Chem. Commun., 480 (1971)
  85. Coates GE, Green MLH, Wade K, "Organometallic Compounds," Barnes and Noble, Vol. 1, p. 295 (1967)
  86. Tsubouchi K, Masu K, Shigeeda N, Matano T, Hiura Y, Mikoshiba N, Appl. Phys. Lett., 57, 1221 (1990) 
  87. Shinzawa T, Sugai K, Kishida S, Okabayashi H, "Tungasten and Other Advanced Metals for VLSI/ULSI Applications," MRS, Pittsburgh, p. 377 (1990)
  88. Sasaoka C, Mori K, Kato Y, Usui A, Appl. Phys. Lett., 55, 741 (1989) 
  89. Levy RA, Gallagher PK, Contolini R, Schrey F, J. Electrochem. Soc., 132, 457 (1985) 
  90. Ruff JK, Hawthorne MF, J. Am. Chem. Soc., 82, 2141 (1960) 
  91. Gladfelter WL, Boyd DC, Jensen KF, Chem. Mater., 1, 339 (1989) 
  92. Baum TH, Larson CE, Jackson RL, Mater. Res. Soc. Symp. Proc., 129, 119 (1989)
  93. Beach DB, Blum SE, LeGoues FK, J. Vac. Sci. Technol. A, 7, 3117 (1989) 
  94. Baum TH, Larson CE, Jackson RL, Appl. Phys. Lett., 55, 1264 (1989) 
  95. Gross ME, Fleming CG, Cheung KP, Heimbrook LA, J. Appl. Phys., 69, 2589 (1991) 
  96. Gross ME, Bubois LH, Nuzzo RG, Cheung KP, Mater. Res. Soc. Symp. Proc., 204, 383 (1991)
  97. Bubois LH, Zegarski BR, Gross ME, Nuzzo RG, Surf. Sci., 244, 89 (1991) 
  98. Simmonds MG, Gladfelter WL, Nagaraja R, Szymanski W, Ahn KH, McMurry PH, J. Vac. Sci. Technol. A, 9, 2782 (1991) 
  99. Simmonds MG, Phillips EC, Hwang JW, Gladfelter WL, Chemtronics, 5, 155 (1991)
  100. Glass JA, Kher S, Spencer JT, Thin Solid Films, 207, 15 (1992) 
  101. Houlding VH, Coons DE, "Proc. 7th Annual Workshop on Tungsten and Other Advanced Metals for ULSI Applications," MRs, Pittsburgh, p. 203 (1990)
  102. Gross ME, Cheung Kp, Fleming CG, Kovalchick J, Heimbrook LA, J. Vac. Sci. Technol. A, 9, 57 (1991) 
  103. Hitsch CW, Kniseley RN, Spectrochimi Acta, 19, 1385 (1963) 
  104. Fraser GW, Greenwood NN, Straughan BP, J. Chem. Soc., 3742 (1963) 
  105. Almenningen A, Gundersen G, Haugen T, Haaland A, Inorg. Chem., 7, 1575 (1968) 
  106. Atwood JL, Bennett FR, Elms FM, Jones C, Raston CL, Robinson KD, J. Am. Chem. Soc., 113, 8183 (1991) 
  107. Heitsch CW, Nordrnan CE, Prry RW, Inorg. Chem., 2, 508 (1963) 
  108. Dubois LH, Zegarski BR, Kao CT, Nuzzo RG, Surf. Sci., 236, 77 (1990) 
  109. Foord JS, Murrell AJ, O'Hare D, Singh NK, Wee TS, Whitaker TJ, Chemtronics, 4, 262 (1989)
  110. Wee ATS, Murrell AJ, Singh NK, O'Hare D, Foord JS, J. Chem. Soc.-Chem Commun., 11 (1990)
  111. Nechiporenko GN, Petukhova LB, Rozenberg AS, Bull. Acad. Sci. USSR, 24, 1584 (1975) 
  112. Mundenar JM, Murphy R, Tsuei KD, Plummer EW, Chem. Phys. Lett., 143, 593 (1988) 
  113. Paul J, Phys. Rev., B, Condens. Matter, 37, 6164 (1988)
  114. Hara M, Domen K, Onishi T, Nozoye H, Nishihara C, Kaise Y, Shindo H, Surf. Sci., 242, 459 (1991) 
  115. Heitsch CW, Nature, 195, 995 (1962)
  116. Hamilton JF, Logel PC, J. Catal., 29, 253 (1973) 
  117. Lelental M, J. Electrochem. Soc., 120, 1650 (1973)
  118. Jarrold MF, Bower JE, J. Am. Chem. Soc., 110, 70 (1988) 
  119. Cox DM, Trevor DJ, Whetten RL, Kaldor A, J. Phys. Chem., 92, 421 (1988) 
  120. Hirashita N, Kinoshita M, Aikawa I, Ajioka T, Appl. Phys. Lett., 56, 451 (1990) 
  121. Gross ME, Harriott LR, Opila RL, J. Appl. Phys., 68, 4820 (1990) 
  122. Sekiguchi A, Kobayashi T, hosokawa N, Asamaki T, Jpn. J. Appl. Phys., 27, 364 (1988)
  123. Kobayashi T, Sekiguchi A, hosokawa N, Asamaki T, Mater. Res. Soc. Symp. Proc., 131, 363 (1989)
  124. SekiguchiA, Kobayashi T, Hosokawa N, Asamaki T, J. Vac. Sci. Technol. A, 8, 2976 (1990) 
  125. Sekiguchi A, kobayashi T, Hosokawa N, Asamaki T, "Tungsten and Other Advanced Metals for VLSI/ULSI Applications V," MRS, Pittsburgh, p. 383 (1990)
  126. Kobayashi T, Sekiguchi A, Hosokawa N, Asamaki T, Jpn. J. Appl. Phys., 27, L1775 (1988) 
  127. Nishikawa S, Tani K, Yamaji T, J. Mater. Res., 7, 345 (1992)
  128. Yamada I, Usui H, Tanaka S, Dahmen U, Westmacott H, J. Vac. Sci. Technol. A, 3, 1443 (1990)
  129. Hair ML, Hertl W, J. Phys. Chem., 77, 2070 (1973) 
  130. Bakardjiev I, Majdraganova I, Bliznakov G, J. Non-Cryst. Solids, 20, 349 (1976) 
  131. Morrow BA, Hardin AH, J. Phys. Chem., 83, 3135 (1979) 
  132. Kinney JB, Stale RH, J. Phys. Chem., 87, 3735 (1983) 
  133. Sakharovskaya GB, Korneev NN, Smirnov NN, Popov AF, J. Gen. Chem. USSR, 44, 560 (1974)
  134. Fleming CG, Blonder GE, Higashi GS, Mater. Res. Soc. Symp. Proc., 101, 183 (1988)
  135. Masu K, Tsubouchi K, Shigeeda N, Matano T, Mikoshiba N, Appl. Phys. Lett., 56, 1543 (1990) 
  136. Kato T, Ito T, Maeda M, J. Electrochem. Soc., 135, 455 (1988) 
  137. Osgood JRM, Annu. Rev. Phys. Chem., 34, 77 (1983) 
  138. Tsao JY, Ehrlich DJ, J. Cryst. Growth, 68, 176 (1984) 
  139. Tsao JY, Ehrlich DJ, Appl. Phys. Lett., 45, 617 (1984) 
  140. Higashi GS, Fleming CG, Appl. Phys. Lett., 48, 1051 (1986) 
  141. Blonder GE, Higashi GS, Flerning CG, Appl. Phys. Lett., 50, 766 (1987) 
  142. Higashi GS, Blonder GE, Flerning CG, McCrary VR, Donnelly VM, J. Vac. Sci. Technol. B, 5, 1441 (1987) 
  143. Mantell DA, Appl. Phys. Lett., 53, 1387 (1988) 
  144. Higashi GS, Chemtronics, 4, 123 (1989)
  145. Wood TH, White JC, Thacker BA, Appl. Phys. Lett., 42, 408 (1983) 
  146. Zhang Y, Stuke M, J. Cryst. Growth, 93, 143 (1988) 
  147. Zhang Y, Stuke M, Chem. Phys. Lett., 149, 310 (1988) 
  148. Zhang Y, Stuke M, J. Phys. Chem., 93, 4503 (1989) 
  149. Zhang Y, Stuke M, Chemtronics, 4, 71 (1989)
  150. Zhang Y, Stuke M, Mater. Res. Soc. Symp. Proc., 131, 375 (1989)
  151. Zhang Y, Stuke M, Jpn. J. Appl. Phys., 27, L1349 (1988) 
  152. Zhang Y, Stuke M, Chemtronics, 3, 230 (1988)
  153. Beuerrnann T, Stuke M, Chemtronics, 4, 189 (1989)
  154. Zhang Y, Stuke M, Chem. Phys. Lett., 178 (1991) 
  155. Mantell Da, Orlowski TE, Mater. Res. Soc. Symp. Proc., 101, 171 (1988)
  156. Higashi GS, Appl. Surf. Sci., 43, 6 (1989) 
  157. Higashi GS, RAghavachari K, Steigerwald ML, J. Vac. Sci. Technol. B, 8, 103 (1990) 
  158. Flicstein J, Appl. Surf. Sci., 36, 443 (1989) 
  159. Beuermann T, Stuke M, Appl. Phys. B-Lasers Opt., 49, 145 (1989) 
  160. Ehrlich DJ, Osgood JRM, Chem. Phys. Lett., 79, 381 (1981) 
  161. Higashi GS, Rothberg LJ, Fleming CG, Chem. Phys. Lett., 115, 167 (1985) 
  162. Higashi GS, Rothberg LJ, J. Vac. Sci. Technol. B, 3, 1460 (1985) 
  163. Higashi GS, Rothberg LJ, Appl. Phys. Lett., 47, 1288 (1985) 
  164. Lubben D, Motooka T, Greene JE, Phys. Rev., B, Condens. Matter, 39, 5245 (1989)
  165. Lubben D, Motooka T, Greene JE, Wendelken JF, Sundgren J, Salaneck WR, Mater. Res. Soc. Symp. Proc., 101, 151 (1988)
  166. Motooka T, Rev. Laser Eng., 18, 712 (1990)
  167. Menon M, Allen RE, J. Vac. Sci. Technol. B, 7, 729 (1989) 
  168. Bouree JE, Flicstein J, Nissim YI, Mater. Res. Soc. Symp. Proc., 75, 129 (1987)
  169. Bouree JE, Flicstein J, Mater. Res. Soc. Symp. Proc., 101, 55 (1988)
  170. Flicstein J, Bouree JE, Bresse JF, Pougnet AM, Mater. Res. Soc. Symp. Proc., 101, 49 (1988)
  171. Bouree JE, Flicstein J, Bresse JF, Rommeluere JF, Pougnet AM, Mater. Res. Soc. Symp. Proc., 129, 251 (1989)
  172. Orlowski TE, Mantell DA, Mater. Res. Soc. Symp. Proc., 101, 165 (1988)
  173. Oprysko MM, Beranek MW, J. Vac. Sci. Technol. B, 5, 496 (1987) 
  174. Solanki R, Ritchie WH, Collins GJ, Appl. Phys. Lett., 43, 454 (1983) 
  175. Motooka T, Gorbatkin S, Lubben D, Greene JE, J. Appl. Phys., 58, 4397 (1985) 
  176. Motooka T, Gorbatkin S, Lubben D, Eres D, Greene JE, J. Vac. Sci. Technol. A, 4, 3146 (1986) 
  177. Eres D, Motooka T, Gorbatkin S, Lubben D, Green JE, J. Vac. Sci. Technol. B, 5, 848 (1987) 
  178. Brum JL, Tong P, Koplitz B, Appl. Phys. Lett., 56, 695 (1990) 
  179. Fischer M, Luckerath R, Balk P, Richter W, Chemtronics, 3, 156 (1988)
  180. Okabe H, Emadi-Babaki MK, McCrary VR, J. Appl. Phys., 69, 1730 (1991) 
  181. Yau S, Saltz D, Nayfeh MH, Appl. Phys. Lett., 57, 2913 (1990) 
  182. Higashi GS, Steigerwald ML, Appl. Phys. Lett., 54, 81 (1989) 
  183. Cacouris T, Scelsi G, Scarmozzino R, Osgood JRM, Krchnavek RR, Mater. Res. Soc. Symp. Proc., 101, 43 (1988)
  184. Cacouris T, Scelsi G, Shaw P, Scarmozzino R, Osgood RM, Appl. Phys. Lett., 52, 1865 (1988) 
  185. Hanabusa M, Hayakawa K, Oikawa A, Maeda K, Jpn. J. Appl. Phys., 27, L1392 (1988) 
  186. Hanabusa M, Oikawa A, Cai PY, J. Appl. Phys., 66, 3268 (1989) 
  187. Hanabusa M, Ikeda M, Mater. Res. Soc. Symp. Proc., 158, 135 (1990)
  188. Scarmozzino R, Cacouris T, Osgood JRM, Mater. Res. Soc. Symp. Proc., 158, 121 (1990)
  189. Sekiguchi A, Kobayashi T, Hosokawa N, Asamaki T, Jpn. J. Appl. Phys., 27, 364 (1988)
  190. Kobayashi T, Sekiguchi A, Hosokawa N, Asamaki T, Mater. Res. Soc. Symp. Proc., 131, 363 (1989)
  191. Sekiguchi A, Kobayashi T, Hosokawa N, Asamaki T, J. Vac. Sci. Technol. A, 8, 2976 (1990) 
  192. Sekiguchi A, Kobayashi T, Hosokawa N, Asamaki T, "Tungsten and Other Advanced Metals for VLSI/ULSI Applications V," MRS, Pittsburgh, p. 383 (1990)
  193. Simmons MG, Gladfelter WL, Li H, McMurry PH, J. Vac. Sci. Technol. A, 11(6), 3026 (1993) 
  194. Lee KI, Kim YS, Joo SK, J. Electrochem. Soc., 139, 3578 (1992) 
  195. Frigo DM, Eijden GJM, Reuvers PJ, Smit CJ, Chem. Mater., 6, 190 (1994) 
  196. Jones AC, Auld J, Rushworth SA, Critshlow GW, J. Cryst. Growth, 135, 285 (1994) 
  197. Gladfelter WL, Chem. Mater., 5, 1372 (1993) 
  198. Simmonds MG, Taupin I, Gladfeiter WL, Chem. Mater., 6, 935 (1994) 
  199. Elms FM, Lamb RN, Pigram PJ, Gardiner MG, Wood BJ, Raston CL, Chem. Mater., 6, 1059 (1994) 
  200. Takeyasu N, Kawano Y, Kondoh E, Katagiri T, Yamamoto H, Shinriki H, Ohta T, Jpn. J. Appl. Phys., 33, 424 (1994)