Previous Article Next Article Table of Contents Journal of the Electrochemical Society, Vol.159, No.6, S17-S17, 2012 DOI10.1149/2.119206jes Export Citation Erratum: Charged Defect Quantification in Pt/Al2O3/In0.53Ga0.47As/InP MOS Capacitors (vol 158, pg G103, 2011) Long RD, Shin B, Monaghan S, Cherkaoui K, Cagnon J, Stemmer S, McIntyre PC, Hurley PK Please enable JavaScript to view the comments powered by Disqus.
