Materials Chemistry and Physics, Vol.134, No.2-3, 886-898, 2012
Structural properties and electrical resistivity behaviour of La1-x KxMnO3 (x=0.1, 0.125 and 0.15) manganites
We report structural features and electrical conductivity behaviour of the potassium doped LaMnO3 perovskite. La1-x KxMnO3 perovskites (x = 0.1, 0.125 and 0.150) have been prepared by the solid-state reaction method and characterised by X-ray diffraction (XRD), energy dispersive X-ray analysis (EDX), scanning electron microscopy (SEM), and dc electrical resistivity. The Rietveld refinements of X-ray diffraction patterns identify rhombohedrally-distorted structure with space group R (3) over barC. The resistivity of all the samples exhibit metal-insulator transition, at about 244, 259, and 280 K, respectively which enhances on application of 5 T field. At low temperatures (<= 30 K), resistivity shows an upturn which on application of magnetic field approximate to 5 T suppresses. The metallic resistivity (H = 0, 5 T) behaviour is analysed in terms of electron-phonon, electron-electron and electron-spin fluctuation scattering. The small polaron conduction is adequate to explain semiconducting resistivity (H = 0, 5 T). The resistivity upturn (H = 0) is explained by considering Coulomb interaction and Kondo-like spin dependent scattering. For H = 5 T, Coulomb interaction between carriers strongly enhanced by disorder is sufficient to explain the resistivity upturn. (c) 2012 Elsevier B.V. All rights reserved.
Keywords:Magnetic materials;Annealing;Electron microscopy;Energy dispersive analysis;Electrical characteristion;Electrical properties