Sb(2)S(3) thin films prepared by electrodeposition on indium tin oxide coated glass substrate were irradiated with 150 MeV Ni(11+) ions for various fluence in the range of 10(11)-10(13) ions/cm(2). The modifications in the structure, surface morphology and optical properties have been studied as a function of ion fluence. X-ray diffraction (XRD) analysis indicates a shift in the (2 4 0) peak position towards lower diffraction angle and a decrease in grain size with increase in ion fluence. Presence of microcracks due to irradiation induced grain splitting effect has been observed from the SEM micrograph at higher ion fluence. The optical absorbance spectrum revealed a shift in the fundamental absorption edge and the band gap energy increased from a value of 1.63 eV for as-deposited films to 1.80 eV for the films irradiated with 10(13) ions/cm(2). (C) 2010 Elsevier B.V. All rights reserved.