화학공학소재연구정보센터
Journal of Adhesion, Vol.52, No.1, 167-186, 1995
Comparison between FT-IR and XPS characterization of carbon fiber surfaces
Fourier transform infrared internal reflection spectroscopy and X-ray photoelectron spectroscopy XPS have been applied to investigate the surface of polyacrylonitrile-based carbon fibers treated by chemical oxidation and electrochemical oxidation. We have found that infrared spectroscopy has comparable sensitivity to XPS and that the amount of the functionality introduced at the fiber surface depends on the oxidation time in the case of chemical oxidation and on the electrolyte used in the case of electrochemical oxidation.