| 번호 | 제목 |
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| 1 |
Electrical characterization of interface and bulk traps in Metal-Oxide-Semiconductor Field Effect Transistors with hafnium based dielectric Tea Wan Kim, Rino Choi, Tae Young Jang 한국재료학회 2009년 봄 학술대회 |
| 번호 | 제목 |
|---|---|
| 1 |
Electrical characterization of interface and bulk traps in Metal-Oxide-Semiconductor Field Effect Transistors with hafnium based dielectric Tea Wan Kim, Rino Choi, Tae Young Jang 한국재료학회 2009년 봄 학술대회 |