| 학회 | 한국고분자학회 |
| 학술대회 | 2005년 봄 (04/14 ~ 04/15, 전경련회관) |
| 권호 | 30권 1호, p.14 |
| 발표분야 | 나노구조형 고분자 분광분석 |
| 제목 | The Characteristic Analysis of OLED using various surface analysis techniques |
| 초록 | Since the organic light-emitting device (OLED) retains high luminance with a wider view angle and also needs a lower driving voltage than conventional LCDs, it is regarded as a next generation display device. Recently there is a rapid growth of the R&D of organic thin film electronics. Most of the presently feasible applications use the device structures of thin film devices, in which a layer of multilayer of organic material is sandwiched between metal or oxide electrodes. Since device functions come from the electrons and holes in these devices, the electronic structure of such materials in the bulk, in the film, and at the interfaces plays essential role in the organic nano-device performances. In this presentation, it will be introduced that the progress of my research project to reveal the nature of both interfaces residing in OLED by investigating the electronic structures and the OLED degradation mechanisms using electron spectroscopy techniques such as UPS (Ultraviolet Photoelectron Spectroscopy)/ XPS (X-ray photoelectron spectroscopy)/ NEXAFS (Near Edge X-ray Absorption Fine Structure) and SPEM(Scanning Photoelectron Microscopy). In photoelectron spectroscopy studies, it was observed that the interlayer deposition yields the valence band shift, which results in the marked device performance improvement. These analytical approaches for OLED should provide the essential information on fundamental understanding for Metal/Organic interface and the degradation mechanism of organic nano-devices. The application of these techniques to various systems related to organic electronic devices will give new insights into the characterization of OLEDs and its related subjects like solar cell, organic nano-devices. |
| 저자 | 이주한 |
| 소속 | 한국기초과학지원(연) |
| 키워드 | OLED; XPS; UPS; NEXAFS; SPEM; interface; degradation. |
