화학공학소재연구정보센터
학회 한국재료학회
학술대회 2016년 봄 (05/18 ~ 05/20, 여수 디오션리조트 )
권호 22권 1호
발표분야 A. 전자/반도체 재료 분과
제목 Investigation of threshold switching in phase-change memory using TCAD simulation
초록 Phase change memory (PCM) is a promising next-generation memory device along with ReRAM and MRAM. An important characteristic of the PCM is that execution-in-place operation is possible unlike conventional NAND flash memory. In other words, overwriting data is possible in the PCM without erase operation. The key reason is the threshold switching behavior of amorphous chalcogenide material. In this presentation, we will show a TCAD simulation of threshold switching in PCM cell considering known physical mechanisms. Eventually, we will construct an integrated simulation of PCM cell and ovonic threshold switch (OTS).  
저자 조영재1, 공영민2, 권용우1
소속 1홍익대, 2울산대
키워드 Phase-change memory; threshold switching; modeling and simulation; TCAD
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