| 학회 | 한국공업화학회 |
| 학술대회 | 2010년 가을 (10/27 ~ 10/29, 대전컨벤션센터) |
| 권호 | 14권 2호 |
| 발표분야 | 전기화학 |
| 제목 | XTEM and SIMS study of ion-implanted YSZ |
| 초록 | YSZ pellets have been irradiated with ion beams and the implantation effects have been investigated using XTEM, XRD, EDS and SIMS. YSZ had been irradiated with protons or Xe ions at room temperature. The ion energy was 120 keV or 5 MeV and the fluence was in therange of 1*1015 ~ 1*1018 ions/cm2. The results of SRIM calculations was also presented. |
| 저자 | 김태형, 이인자 |
| 소속 | 동국대 |
| 키워드 | SOFC; YSZ; ion beam |
