화학공학소재연구정보센터
학회 한국고분자학회
학술대회 2004년 가을 (10/08 ~ 10/09, 경북대학교)
권호 29권 2호, p.697
발표분야 분자전자 부문위원회
제목 Atomic force microscope lithography on poly(3,4-ethylenedioxythiophene) thin films
초록 Atomic force microscope (AFM) lithography is one of good methods for fabrication of nanostructure using organic thin films. Poly(3,4-ethylenedioxythiophene) (PEDOT) is a conducting polymer based on a heterocyclic thiophene ring bridged by two electron-donating oxygen atoms. It can be spin-coated on various conductive and non-conductive substrates. Before this study was investigated, we had expected that when use different dopants, lithography property may differ from one another. So, we used Batron P and PES-SIN. The dopants for each Batron P and PES-SIN are poly(4-styrenesulfonate) (PSS) and di(2-ethylhexyl)sulfosuccinate (DEHS). I-V curves for Batron P and PES-SIN thin films were measured to confirm different properties for Batron P and PES-SIN. In this study, we fabricated patterns on PEDOT thin film using atomic force microscopy.
저자 김용일, 이해원, 오희영, 윤현진
소속 한양대
키워드 Conducting polymer; Poly(3; 4-ethylenedioxythiophene); AFM lithography
E-Mail