| 초록 |
We investigated the water stability of organic thin-film transistors (OTFTs) as the surface of dielectric materials. For this test, water-stable semiconductor rubrene is deposited and crystallized on silicone dioxide dielectrics and bilayer dielectrics of cross-linked polymers on silicone dioxide. For the crosslinking of selected polymer polystyrene (PS) and poly-4-vinylphenol (PVP), different crosslinking method of conventional thermal method and electron beam or ultra-violet (UV) irradiation methods were used. By the polymer-treatment of dielectrics, the aqueous stability of TFTs were enhanced comparing to the silicone dioxide dielectrics due to the decrease of dielectric surface energy. And also, by successive experiments using different polymers and crosslinking methods, we could investigate the relation between surface conditions of polymers and stability of organic thin-film transistors. |
