| 학회 |
한국재료학회 |
| 학술대회 |
2007년 가을 (11/02 ~ 11/02, 성균관대학교) |
| 권호 |
13권 2호 |
| 발표분야 |
전자재료 |
| 제목 |
Defect Analysis in YBCO thin film Using Slow Positron Annihilation Methods |
| 초록 |
We introduce the slow positron beam method for the analysis of defect concentration. Slow positron with coincidence Doppler broadening spectroscopy was applied to YBCO thin film in order to analyze the defect structures. The samples were irradiated by 0-30 kV positron beam which is 8 mm diameter and were varied with the temperature between 15 to 290 K. The S-parameter values of the LAO and sapphire substrate samples varied, although the values of YBCO film were not changed |
| 저자 |
이종용1, M. Hasegawa2, K. Inoue3, 김재홍2, Y. Nagai3
|
| 소속 |
1한남대, 2IMR, 3Tohoku Univ. |
| 키워드 |
YBCO; thin film; Slow positron
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| E-Mail |
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